• 2026/12/17 10:15 ~ 11:50
    Venue:Innovation Stage(West hall 4)
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    Semiconductor Backend Process
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    10:15 ~ 10:55
    Market Outlook and Ecosystem of Semiconductor Back-End Manufacturing
    Advances in AI and Advanced Packaging and Expectations for Materials and Processing Technologies
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    Mr. Shoji Uegaki
    Crane Research

    10:15 ~ 11:50
    Challenges in Advanced Semiconductor Packaging and Expectations for Materials in the Era of AI and Chiplets
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    【Abstract】

    The rapid growth of artificial intelligence (AI) and high-performance computing (HPC) is driving demand for higher performance, greater memory capacity, and lower power consumption in semiconductor systems. Advanced packaging technologies, including chiplet integration and 2.5D/3D integration, are becoming increasingly important. However, these technologies face challenges in fine-pitch interconnections, signal and power integrity, thermal management, mechanical stress caused by thermal expansion mismatch, and long-term reliability. This presentation reviews recent trends and key challenges in advanced semiconductor packaging, including RDL-based and glass interposers. It also discusses the requirements for insulating resins, adhesive and encapsulation materials, thermal management materials, and other advanced materials essential for next-generation semiconductor packaging.

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    Mr. Hiroyoshi Yoshida
    Flexible 3D System Integration Laboratory,SANKEN,The University of Osaka
    【Profile】

    Hiroyoshi Yoshida is a Specially Appointed Researcher at the Flexible 3D System Integration Laboratory, SANKEN, The University of Osaka, Japan. He has extensive experience in semiconductor packaging substrates, quality and reliability evaluation, and technical standardization. He is currently involved in developing evaluation standards for advanced semiconductor packaging through JEITA and international standardization activities within the IEC. He also provides technical advice to industry and delivers lectures on advanced semiconductor packaging technologies and reliability challenges.

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